This course will describe a variety of techniques used to characterize the structure and composition of engineering materials, including metals, ceramics, polymers, composites, and semiconductors. The emphasis will be on microstructural characterization techniques, including optical and electron microscopy, x-ray diffraction, and acoustic microscopy. Surface analytical techniques, including Auger electron spectroscopy, secondary ion mass spectroscopy, x-ray photoelectron spectroscopy, and Rutherford backscattering spectroscopy. Real-world examples of materials characterization will be presented throughout the course, including characterization of thin films, surfaces, interfaces, and single crystals.

Course instructor: 
McGuiggan